AFM (Atomic Force Microscopy)

Submitted by admin on Tue, 08/02/2022 - 10:44

Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer. The purpose of this instrument is to analyse the surface properties of thin films.

Instument image
1
Company
Bruker
Model
Dimension ICON PT
Purpose
Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer. The purpose of this instrument is to analyse the surface properties of thin films.